FEI


With more than 60 years of innovation and leadership, FEI enables customers to find meaningful answers to questions that accelerate breakthrough discoveries, increase productivity, and ultimately change the world. FEI designs, manu­factures, and supports the broadest range of high-performance microscopy workflows that provide images and answers in the micro-, nano-, and picometer scales. Combining hardware and software expertise in electron, ion, and light microscopy with deep application knowledge in the materials science, life sci­ences, electronics, and natural resources markets, the worldwide FEI team of 2,700+ employees is dedicated to customers' pursuit of discovery and resolution to global challenges.

Apreo

The most versatile high-performance SEM Apreo's revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. This makes Apreo the platform of choice for research on nanoparticles, catalysts, powders and nanodevices, without compromising on magnetic sample performance.
Apreo

Aspex

The Aspex Product Group from FEI is a collection of scanning electron microscopes for industrial microscopy solutions which help to optimize quality control, production capacity, and profitability.
Aspex

Inspect

With advanced chamber vacuum technology, the Inspect™ line of scanning electron microscopes (SEM) builds on FEI's world-class electron optics and sample throughput technologies. When inspection, characterization, process control and failure analysis are important, the Inspect S50 and Inspect F50 models' high-resolution imaging is a must.
Inspect

MLA

The MLA (an acronym for Mineral Liberation Analyzer) is an automated mineral analysis system that can identify minerals in polished sections of drill core, particulate, or lump materials, and quantify a wide range of mineral characteristics, such as mineral abundance, grain size, and liberation.
MLA

Nova NanoSEM

The Nova NanoSEM™ scanning electron microscope delivers best in class imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline operations in your laboratory, the Nova NanoSEM enables owners the ability to gain the most comprehensive answers in the least amount of time.
Nova NanoSEM

QEMSCAN

QEMSCAN® is a fully automated, non-destructive, micro-analysis system that provides rapid, statistically reliable and repeatable, mineralogical, petrographic and metallurgical data, from virtually any inorganic, and some organic, materials. It is used in the mining industry for mineral exploration, ore characterization, and mineral process optimization applications.
QEMSCAN

Quanta SEM

The FEI Quanta line includes six variable-pressure and environmental scanning electron microscopes (ESEM™). All of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.
Quanta SEM

Teneo

For metals researchers, academic and industrial research institutions, FEI's Teneo SEM provides Ultra High Resolution imaging together with the highest throughput analytical performance. A revolution in detection - the unique Trinity™ detection scheme delivers highest contrast on the widest range of samples for fastest imaging and easy interpretation of images.
Teneo

Verios XHR SEM

The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
Verios XHR SEM

Metrios TEM

The Metrios system is the first TEM dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. Extensive automation of the basic TEM operation and measurement procedures minimizes requirements for specialized operator training.
Metrios TEM

Talos

Talos™ is a new generation in TEM, built to deliver rapid access to 2D and 3D data so that you can concentrate on discovery. With configurations for materials research and life sciences research, Talos is a truly versatile system with many innovations that will serve your research needs for years to come.
Talos

Tecnai

The FEI Tecnai™ transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries.
Tecnai

Titan

Since its introduction in 2005, the Titan's superior product design and proven ability to deliver ground-breaking results have made it the preferred scanning/transmission electron microscope (S/TEM) of leading researchers around the world.
Titan

ExSolve Wafer TEM Prep

The Metrios system is the first TEM dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. Extensive automation of the basic TEM operation and measurement procedures minimizes requirements for specialized operator training.
ExSolve Wafer TEM Prep

Helios NanoLab

The Helios NanoLab™ DualBeam™ has always combined FEI's best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. For scientists working at nanotechnology's leading edge, Helios NanoLab lets them push boundaries and create new possibilities for materials research.
Helios NanoLab

Scios

FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments.
Scios

Versa 3D

Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam instrument to date. The Versa 3D offers state-of-the-art imaging and analytical performance to deliver a greater range of 3D data from even your most challenging samples.
Versa 3D

OptiFIB

The OptiFIB circuit edit systems use focused ion-beam (FIB) technology and advanced chemistry to modify individual circuit elements. These edits are designed to validate design changes before expensive and time-consuming modifications are implemented on photomask sets. Featuring patented coaxial columns, our circuit edit systems lead the industry in precision and throughput, as well as offering the broadest range of FIB chemistries available.
OptiFIB

V400ACE Focused Ion Beam

The V400ACE™ Focused Ion Beam (FIB) system incorporates the latest developments in ion column design, gas delivery and end point detection to provide fast, efficient, cost-effective editing on advanced integrated circuits.
V400ACE Focused Ion Beam

Vion Plasma Focused Ion Beam

Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam instrument to date. The Versa 3D offers state-of-the-art imaging and analytical performance to deliver a greater range of 3D data from even your most challenging samples.
Vion Plasma Focused Ion Beam

HeliScan microCT for Oil and Gas

Versatile micro-computed tomography (microCT) imaging and software system designed for the quantitative analysis of reservoir rocks.
HeliScan microCT for Oil and Gas

Phase Plate

Increase contrast and retrieve more information from delicate biological samples with the FEI Phase Plate. Engineered for high quality, stability and longevity, the FEI Phase Plate is the ideal companion to demanding cutting-edge Cryo-TEM biological research.
Phase Plate

Falcon II Direct Electron Detector

With its unsurpassed detective quantum efficiency and sensitivity, Falcon delivers optimized image detection of those beam-sensitive specimens that require extreme low-dose conditions.

Falcon II Direct Electron Detector

NanoEx 3D STM and Electrical Probe

The FEI NanoEx 3D STM and Electrical Probe is our new TEM specimen holder with a patented Piezo-controller 3D probe for in situ S/TEM imaging and elemental analysis at elevated temperatures.
NanoEx 3D STM and Electrical Probe

NanoEx 3D Indenter

The FEI NanoEx 3D is a double-tilt TEM specimen holder that includes a nanoindenter system allowing in-situ nano-indentation specimen characterization.​ Record in situ point-to-point force measurement plus conductivity.
NanoEx 3D Indenter

NanoEx-i-v

The FEI NanoEx-i/v is a single-tilt TEM specimen heating and biasing holder for in situ S/TEM imaging and elemental analysis at elevated temperatures.​ NanoEx-i/v is the ideal solution for precise experiments in a wide range of applications that require in situ heating of nanomaterials, such as studies of nanoscale annealing behavior, phase transformations in metals, structural changes and sintering phenomena in catalyst nanosystems, quenching, segregation/diffusion phenomena, and more.
NanoEx-i-v